IDEA #7YZLE2 OBTAINING OF THE CHARGED NANOPARTICLES BY MEANS OF THE POINT IONS SOURCE

OBTAINING OF THE CHARGED NANOPARTICLES BY MEANS OF THE POINT IONS SOURCE Description The means of dispersed phase of the point ions source have been used for obtaining of the charged nanoparticles. The source represents the compact graphite container with the working matter inside of which a thin high-melting needle is bulged out. The smelt matter wets a surface of needle. The emission of ions occurs at voltages of 5-6 kV applied between the needle and diaphragm. The generation of the charged droplets occurs at certain value of the ion current by the threshold manner. The oscillations of the ion current of frequency 15-20 MHz are generated simultaneously as result of capillar instability of surface of the conductive liquid at high electric field. Sizes of nanodroplets determined by means of electron microscope composes continuous spectrum from 2 nm up to 20 nm, their average specific charge is equal to 5.104 Cl/kg. The number of particles of least size on three orders of magnitude exceeds number of particles of the greatest size. The In, Sn, NiAlB have been used as working matters at carrying out of our experiments. It is possible the creation of various surface quantum structures by means of these nanoparticles. Energy of the charged nanoparticles can be regulated by means of an electric field. Nanoparticles of intrinsic semiconductors and their compounds can be obtained in the modified design of a source with a porous edge. Innovative Aspects and Main Advantages Nanoparticles are obtained in a ready kind; it is not necessary to spend a long time to form them; speeds and trajectories of particles are manageable; it is possible the separation of particles in the sizes by means of the mass-analyzer. It is also possible an arrangement of nanoparticles on required coordinates of the substrate’s surface by means of probe manipulator after their deposition. Areas of application Nanotechnology, ion-plasma technology, thin-film electronics. Stage of development Laboratory tested technology of obtaining of the ions and nanoparticles of semiconductor materials. Fig.1. Nanodroplets deposited on the surface of a polished metal substrate: (a) AFM image of indium nanodroplets; (b) Histograms of the lateral dimensions of tin nanodroplets deposited at different beam currents, as determined using TEM micro- graphs. Contact details Institute of Physics NASA Contact person: Hasanov Ilkham Soltan oglu Address: 33, H. Javid Avenue AZ1143, Baku, Azerbaijan Phone/Fax: (99412)-432-43-36 E-mail: ilkhamg@mail.ru